Dr. Tan gave an invited talk in the 13^th Stress workshop, which is dedicated to the chip reliability issues on Oct. 15, 2014 in Austin, TX.  The presentation is titled  as follows:

13th International Workshop on Stress-Induced Phenomena in Microelectronics (Stress Workshop), The University of Texas at Austin, Austin, Physics-Based Electromigration Assessment for Power Grid Networks, Oct. 15^th, 2014.