Dr. Sheldon Tan has been re-apponted as the Editor-in-Chief (EiC) for Integration, The VLSI Journal for the coming 2018-2020 period. Dr. Tan has been the EiC for Integration, The VLSI Journal since 2016. The impact factor of Integration has increased from 0.703 in 2015 to 1.00 in 2016, which represents 42.4% improvement.