Dr. Tan's team published an invited paper in ASPDAC 18 on the fast EM acceleration technique. In this paper, Dr. Tan's team proposed a novel reservoir-based EM acceleration technique, which can lead to very fast EM failure without using traditional temperature or current based acceleration technique. As a result, the new technique can void the collateral damage (due to other failure effects) problems with existing EM acceleration method.  By combined with temperature acceleration technique, the proposed EM acceleration method can lead to 10year to 1 hour acceleration, which can’t be achieved by existing method.

 Z. Sun, S. Sadiqbatcha and S. X.-D. Tan, “Accelerating electromigration aging for fast failure detection for nanometer ICs”,Proc. Asia South Pacific Design Automation Conference (ASP-DAC’18), Jeju Island, Korea,  Jan. 2018. (invited)