Dr. Sheldon Tan has just been awarded a prestigious grant from the National Science Foundation's CISE CCF Core Small program (CCF-2305437). The project, titled "SHF:Small: Learning-based Fast Analysis and Fixing for Electromigration Damage," is funded with $500,000 and spans from September 1, 2023, to August 31, 2026.

This significant grant will provide essential support for Dr. Tan's research group as they continue their groundbreaking work in advancing assessment and optimization techniques for the design of highly efficient and reliable VLSI chips. Their focus extends to critical factors such as electromigration and other aging effects.

Dr. Tan's research group is internationally renowned for their leadership in VLSI reliability and thermal-based analysis and design methodologies, making this award a notable recognition of their contributions to the field.

See also at https://www.nsf.gov/awardsearch/showAward?AWD_ID=2305437&HistoricalAwards=false