Visiting Ph.D. student, Liang Chen's work on fast analytic solution for EM analysis for general multi-segment interconnect wires has been accepted by IEEE Transaction on VLSI. Congratulation on Liang! L. Chen, S. X.-D. Tan, Z. Sun, S. Peng, M. Tang and J. Mao, “Fast analytic electromigration analysis for general multi-segment interconnect wires”, IEEE Transactions on...