Visiting Ph.D. student, Liang Chen's work on new analytic EM analysis method published in TVLSI

Visiting Ph.D. student, Liang Chen's work on fast analytic solution for EM analysis for general multi-segment interconnect wires has been accepted by IEEE Transaction on VLSI. Congratulation on Liang!

L. Chen, S. X.-D. Tan, Z. Sun, S. Peng, M. Tang and J. Mao, “Fast analytic electromigration analysis for general multi-segment interconnect wires”, IEEE Transactions on Very Large Scale Integrated Systems (TVLSI), (accepted).